Static information storage and retrieval – Read only systems – Semiconductive
Reexamination Certificate
2005-02-08
2005-02-08
Phung, Anh (Department: 2824)
Static information storage and retrieval
Read only systems
Semiconductive
C365S189011, C365S229000
Reexamination Certificate
active
06853574
ABSTRACT:
Reducing leakage current when a circuit contains a series of CMOS transistors. The probability that each input signal (connecting to the gate terminal of the corresponding CMOS transistor) will be at a logical value which turns off the corresponding CMOS transistor is determined. A CMOS transistor with a high threshold voltage may be connected to receive an input signal with a high probability to reduce the aggregate leakage current in the circuit. The approach may be used in any environments such as synthesis tools and also manual design methodologies.
REFERENCES:
patent: 3761799 (1973-09-01), Shuey
patent: 5051620 (1991-09-01), Burgin
patent: 6255853 (2001-07-01), Houston
patent: 6308312 (2001-10-01), Houston
patent: 6314041 (2001-11-01), Frey
patent: 6519178 (2003-02-01), Alvandpour et al.
Brady III W. James
Marshall, Jr. Robert D.
Phung Anh
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
LandOfFree
Reducing leakage current in circuits implemented using CMOS... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Reducing leakage current in circuits implemented using CMOS..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Reducing leakage current in circuits implemented using CMOS... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3453699