Reducing dislocations in semiconductors utilizing repeated therm

Fishing – trapping – and vermin destroying

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148DIG3, 148DIG25, 148DIG97, 156612, 357 60, 437 84, 437108, 437132, 437248, 437976, H01L 2120, H01L 21322

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050913336

ABSTRACT:
Dislocation densities are reduced in growing semiconductors from the vapor phase by employing a technique of interrupting growth, cooling the layer so far deposited, and then repeating the process until a high quality active top layer is achieved. The method of interrupted growth, coupled with thermal cycling, permits dislocations to be trapped in the initial stages of epitaxial growth.

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Berkenbilt et al., "Reduction of Stress in Single--Crystal Layers" I.B.M. Tech Discl. Bull. vol. 12, No. 9, p. 1489.
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Tsaur et al., "Efficient GaAs/Ge/Si Solar Cells " Conf. Rec., 16th IEEE Photovoltaic Spec. Conf., San Diego, Calif., Sep. 27-30, 1982, pp. 1143-1148.
Saul, R. H., "Reduced Dislocation Densities in Liquid Phase Epitaxy . . . Growth", J. Electrochem. Soc: Solid State Science, vol. 118, No. 5, 793-795, May 1971.

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