Reduced signal swing in bit lines in a CAM

Static information storage and retrieval – Associative memories – Ferroelectric cell

Reexamination Certificate

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C365S189070, C365S204000

Reexamination Certificate

active

07046537

ABSTRACT:
A Content Addressable Memory device with a bit line that is driven between first and second voltage levels depending on the state of a logic signal applied thereto. The magnitude of the voltage swing between the first and second voltage levels is reduced in comparison to other voltages of the Content Addressable Memory device, or in comparison to the voltage swing of prior art bit lines, so that effects associated with power dissipation by the bit line are reduced. The memory includes a plurality of match lines and a plurality of bit lines, each of the plurality of bit lines coupled to a bit line driver circuit adapted to provide a bit line voltage with reduced signal swing.

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patent: 6678196 (2004-01-01), Regev
Nicky Chau-Chun Lu, “Half VDDBit-Line Sensing Scheme in CMOS DRAM's,” IEEE Journal of Solid-State Circuits, vol. SC-19, No. 4, Aug. 1984.
Seung-Moon Yoo, et al., “A 256M DRAM with Simplified Register Control for Low Power Self Refresh and Rapid Burn-In,” 1994 Symposium on VLSI Circuits Digest of Technical Papers, pp. 85-86.
Masaki Tsukude, et al., “Automatic Voltage-swing Reduction (AVR) Scheme for Ultra Low Power DRAMs,” 1994 Symposium on VLSI Circuits Digest of Technical Papers, pp. 87-88.
T. Inaba, et al., “A 250mV Bit-Line Swing Scheme for a 1V 4Gb DRAM,” 1995 Symposium on VLSI Circuits Digest of Technical Papers, pp. 99-100.

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