Reduced programming pulse width for enhanced channel...

Details Reduced programming pulse width for enhanced channel... Reduced programming pulse width for enhanced channel...

2009-06-22

2011-10-25

Hur, J. H. (Department: 2824)

Static information storage and retrieval

Floating gate

Particular connection

C365S185190, C365S211000

Reexamination Certificate

active

08045384

ABSTRACT:
Program disturb is reduced in a non-volatile storage system during a programming operation by switching from using programming pulses of a longer duration to programming pulses of a shorter duration, partway through the programming operation. A switchover point can be based on temperature, selected word line position and/or tracking of storage elements to a trigger state. The switchover point occurs sooner for higher temperatures, and for drain side word lines. The trigger state can be selected based on temperature. A portion of storage elements which are required to reach the trigger state to trigger a switchover can also be set a function of temperature. Programming pulses of a shorter duration improve channel boosting for inhibited storage elements, thereby reducing program disturb for these storage elements.

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International Search Report & The Written Opinion of the International Searching Authority dated May 10, 2011, International Application No. PCT/US2010/037839 filed Jun. 8, 1020.

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