Reduced jitter clock generator circuit and method for...

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Synchronizing

Reexamination Certificate

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Details

C327S149000, C327S153000, C327S161000

Reexamination Certificate

active

06535038

ABSTRACT:

TECHNICAL FIELD
This invention relates to clock generator circuits, and, more particularly, to clock generator circuits used to apply properly phased clock signals to multiple clocked devices.
BACKGROUND OF THE INVENTION
Periodic clock signals are for a wide variety of purposes in electronic systems, such as memory devices. Clock signals are typically generated by an oscillator, but clock signals generated by an oscillator may have properties that make them unsuitable for some purposes. For example, such clock signals may exhibit excessive phase jitter, i.e., variations in the phase or timing of the clock signal. While phase jitter may not be a problem in many applications, in some applications where timing in a circuit must be precisely controlled, phase jitter can be unacceptable.
On approach to reducing phase jitter is to process the clock signal with a locked-loop, such as a phase-lock loop or a delay-lock loop. The dynamics of feedback in the loop can be controlled, such as by low-pass filtering the loop, so that a processed clock signal generated by the locked-loop has relatively little phase jitter.
Processing a clock signal using a locked-loop provides acceptable performance in applications where the clock signal is applied to a single circuit or relatively few circuits. However, problems can develop if the processed clock signal is applied to a large number of clocked circuits. These problems are essentially twofold. First, it is generally not possible to place the circuits to which the processed clock signal is applied the same distance from the locked-loop. Consequently, transitions of the clock signal can arrive at each of the circuits at different times. Yet the major function of the clock signal is to ensure that signals in all of the circuits are registered at the same time. This problem has been recognized, and attempts have been made to solve it. One approach, for example, is shown in
FIG. 1. A
clock generator circuit
10
includes a driver circuit
16
that receives a pair of complimentary clock signals CLK and CLK*. The driver circuit
16
converts the complimentary clock signals CLK and CLK* into a single-ended clock signal that is applied to a phase-lock loop
20
. The phase-lock loop
20
generates a processed clock signal CLK-P that is applied to several driver circuits
24
. The first driver circuit
24
a
outputs a complimentary pair of clock signals CLK-OUT and CLK-OUT* that are used as complimentary feedback signals. These complimentary feedback signals are applied to a driver circuit
26
that generates a single-ended feedback signal, which is applied to a feedback input of the phase-lock loop
20
.
The remaining driver circuits
24
b-k
output complimentary clock signals CLK-OUT and CLK-OUT* to respective clocked circuits
28
b-k
through respective pairs of conductors
30
b-k
. In the event the clock generator circuit
10
is used, for example, in a memory device, the circuits
28
b-k
may be memory arrays, although the circuits
28
b-k
may instead be any type of circuit found in memory devices. Also, of course, the clock generator circuit
10
may be used in devices other than memory devices.
The clock generator circuit
10
, the clocked circuits
28
and the conductors
30
are preferably fabricated on a common substrate
34
. In the case of an integrated circuit, the substrate
34
will normally be a semiconductor substrate, such as a silicon die. However, the components shown in
FIG. 10
may instead be discrete circuits, in which case the substrate
34
may instead be a printed circuit board, for example.
As mentioned earlier, one of the problems that can develop if the processed clock signals are applied to a large number of circuits is the pairs of clock signals CLK-OUT and CLK-OUT* may arrive at respective circuits
28
b-k
at different times. To solve this problem, the conductors
30
b-k
coupling the clock signals CLK-OUT to the circuits
28
b-k
, respectively, are routed as shown in FIG.
2
.
As shown in
FIG. 2
, all of the conductors
30
b-k
coupling the drivers
24
b-k
(
FIG. 1
) to the circuits
28
b-k
all have the same length. Using this approach, the conductor
30
b
coupling the clock signals CLK-OUT and CLK-OUT* to the circuit
28
b
farthest from the clock generator circuit
10
is relatively direct, while the conductors
30
k
coupling the clock signals CLK-OUT and CLK-OUT* to the circuit
28
k
closest to the clock generator circuit
10
are very serpentine. Although this approach is effective to equalize the times the clock signals CLK-OUT and CLK-OUT* are applied to the respective circuits
28
, the amount of area consumed by the serpentine conductors
30
can be very problematic in some applications. For example, if the clock generator circuit
10
, conductors
30
and clocked circuits
28
are fabricated on a semiconductor die, the serpentine conductors
30
can substantially increase the required size of the semiconductor die and hence the cost of an integrated circuit using the clock generator circuit
10
.
The second problem that can develop if the processed clock signal is applied to a large number of clocked circuits
28
is the creation of phase jitter, which is the very problem the use of the phase-lock loop
20
was intended to avoid. With reference to
FIG. 1
, on each transition of the processed clock signal CLK-P, all of the driver circuits
24
a-k
switch at the same time, thereby drawing current at the same time. The result is a transient increase in current on each transition of the processed clock signal CLK-P, which generally produces a transient decrease in voltage of the power supplied to the phase-lock loop
20
. For most phase-lock loop designs, the voltage transient causes a transient increase or decrease in the phase of the processed clock signal CLK-P produced by the locked-loop
20
. As mentioned above, this transient increase or decrease in the phase of the processed clock signal CLK-P constitutes phase jitter. As mentioned previously, this phase jitter defeats the major reason for using the phase-lock loop
20
, i.e., to reduce phase jitter.
There is therefore a need for a clock generator circuit that can provide a clock signal having reduced phase jitter to several circuits without consuming significant substrate area by routing the clock signals to the circuits through serpentine conductor paths.
SUMMARY OF THE INVENTION
A clock generator circuit and method is used to apply respective clock signals to a plurality of clocked circuits. A processed clock signal is generated by applying an input clock signal to a locked-loop, such as a phase-lock loop. The processed clock signal is delayed a plurality of respective delay times by a suitable delay circuit, such as a plurality of serially coupled delay elements, to generate a plurality of delayed clock signals. Each of the delayed clock signal is coupled through a respective signal path to a respective clocked circuit. The length of the signal paths through which each of the delayed clock signals is coupled is inversely proportional to the delay of the delayed clock signal that is coupled through the signal path. As a result, the delayed clock signals are applied to respective clocked circuits at substantially the same time.


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