Reduced complexity transmission line and waveguide fault tester

Details Reduced complexity transmission line and waveguide fault tester Reduced complexity transmission line and waveguide fault tester

2006-06-13

2006-06-13

Benson, Walter (Department: 2858)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Analysis of complex waves

C324S646000, C324S650000

Reexamination Certificate

active

07061221

ABSTRACT:
A four-port junction is substituted for a six-port junction in a frequency domain reflectometer, which reduces the parts count and therefore cost and size of the reflectometer while improving reliability. The frequency domain reflectometer can alternatively be used as an insertion loss tester. An algorithm including the Hilbert Transform is used to directly calculate the estimated reflection coefficient from the output power measured at only two output ports.

REFERENCES:
patent: 4808912 (1989-02-01), Potter et al.
patent: 6066953 (2000-05-01), Wadell
patent: 6636048 (2003-10-01), Sciacero et al.

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