Reduced active area in a phase change memory structure

Active solid-state devices (e.g. – transistors – solid-state diode – Semiconductor is selenium or tellurium in elemental form

Reexamination Certificate

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Details

C257S209000, C257SE29087, C257SE31008

Reexamination Certificate

active

07858980

ABSTRACT:
A phase change memory structure and method for forming the same, the method including providing a substrate comprising a conductive area; forming a spacer having a partially exposed sidewall region at an upper portion of the spacer defining a phase change memory element contact area; and, wherein the spacer bottom portion partially overlaps the conductive area. Both these two methods can reduce active area of a phase change memory element, therefore, reducing a required phase changing electrical current.

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patent: 2006/0017076 (2006-01-01), Lankhorst et al.
patent: 2005-071954 (2005-04-01), None
patent: 2006001089 (2006-01-01), None

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