Recyclying faulty multi-die packages

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – With contact or lead

Reexamination Certificate

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Details

C257S690000, C257S691000, C365S185110, C365S185180

Reexamination Certificate

active

07569923

ABSTRACT:
The present invention teaches the recycling of a faulty multi-die memory package by isolating the functional part of the package and using it as a smaller memory package.

REFERENCES:
patent: 6262926 (2001-07-01), Nakai
patent: 6434044 (2002-08-01), Gongwer et al.
patent: 6956769 (2005-10-01), Lee
patent: 7308524 (2007-12-01), Grundy et al.
patent: 2006/0097284 (2006-05-01), Ronen

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