Rectangular contact lithography for circuit performance...

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C430S311000, C430S394000, C430S322000

Reexamination Certificate

active

07569308

ABSTRACT:
An optical lithography method is disclosed that uses double exposure of a reusable template mask and a trim mask to fabricate regularly-placed rectangular contacts in standard cells of application-specific integrated circuits (ASICs). A first exposure of the reusable template mask with periodic patterns forms periodic dark lines on a wafer and a second exposure of an application-specific trim mask remove the unwanted part of the dark lines and the small cuts of the dark lines left form the rectangular regularly-placed contacts. All contacts are placed regularly in one direction while unrestrictedly in the perpendicular direction. The regular placement of patterns on the template mask enable more effective use of resolution enhancement technologies, which in turn allows a decrease in manufacturing cost and the minimum contact size and pitch. Since there is no extra application-specific mask needed comparing with the conventional lithography method for unrestrictedly-placed contacts, the extra cost is kept to the lowest. The method of the invention can be used in the fabrication of standard cells in application-specific integrated circuits (ASICs) to improve circuit performance and decrease circuit area and manufacturing cost.

REFERENCES:
Tyrrell et al., Journal of Microlithography, Microfabrication and Microsystems, vol. 1, No. 3, pp. 243-252 (2002).
Fritze et al., Proceedings of SPIE, vol. 5042, pp. 15-29 (2003).
Wang et al., Proceedings of SPIE, vol. 5043, pp. 134-141 (2003).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Rectangular contact lithography for circuit performance... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Rectangular contact lithography for circuit performance..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Rectangular contact lithography for circuit performance... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4137310

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.