Recorded magnetization state measuring method and device

Details Recorded magnetization state measuring method and device Recorded magnetization state measuring method and device

1998-01-07

2000-06-27

Kim, W. Chris

Dynamic magnetic information storage or retrieval

Checking record characteristics or modifying recording...

324212, G11B 502, G01R 3312

Patent

active

060813946

ABSTRACT:
In the recorded magnetization state measurement method of this invention, a recorded magnetization pattern formed on a medium is first detected by a magnetic force microscope (MFM). An MFM output signal extractor then extracts a one-dimensional MFM output signal along the direction of recording at a prescribed MFM reproduction width from the recorded magnetization pattern detected by the magnetic force microscope. A waveform value analyzer then calculates as output reproduction the average value of amplitude of the MFM output signal extracted by the MFM output signal extractor and calculates as medium noise the standard deviation of amplitude of the MFM output signal.

REFERENCES:
patent: 5851643 (1998-12-01), Honda et al.
patent: 5879783 (1999-03-01), Chang et al.
Y. Tang et al., "A Technique for Measuring Nonlinear Bit Shift", IEEE Transactions on Magnetism, vol. 27, No. 6, Nov. 1991, pp. 5316-5318.
T. Lam et al., "Effect of Pole Trimming on Write Properties of Merged MR Heads", IEEE International Magnetics Conference Digest of the Technical Papers, 1995, pp. GP-29.

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