Record condition extraction system and method of dielectric...

Details Record condition extraction system and method of dielectric... Record condition extraction system and method of dielectric...

2005-06-28

2005-06-28

Huber, Paul W. (Department: 2653)

Dynamic information storage or retrieval

Specific detail of information handling portion of system

Electrical modification or sensing of storage medium

C369S053380

Reexamination Certificate

active

06912193

ABSTRACT:
The record condition extraction system (1) of a dielectric recording medium is intended to obtain an applied voltage and an applied time length to be recorded when recording information in the dielectric recording medium. The record condition extraction system (1) is provided with: an applied voltage setting device (11); an applied time length setting device (12); a record control device (13); an applied voltage/applied time length record device (14); a record device (15); a dot radius measurement device (16); a dot radius record device (17); an optimum dot radius detection device (18); a record condition determination device (19); and an output device (20). The applied voltage setting device (11) and the applied time length setting device (12) set a voltage and a time applied to a probe (31) of the record device (15), respectively. The dot radius of a polarization domain38,which is recorded at the record device (15), is measured at the dot radius measurement device (16), and the optimum polarization domain (38) is obtained at the optimum dot radius detection device (18). The applied voltage and the applied time length which have formed the polarization domain (38) are extracted as an optimum record condition.

REFERENCES:
patent: 5418029 (1995-05-01), Yamamoto et al.
patent: 5946284 (1999-08-01), Chung et al.
patent: 6001519 (1999-12-01), Yang et al.
patent: 0 739 004 (1996-11-01), None
patent: 1 154 422 (2001-11-01), None
Matsuura et al, “Fundamental Study on Nano Domain Engineering Using Scanning Nonlinear Dielectric Microscopy”, Jpn. J. Appl. Phys. vol. 40 (2001) pp. 4354-4356, Part 1, No. 6B Jun. 2001.

Affiliated with

Also associated with

Rating

Record condition extraction system and method of dielectric... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Record condition extraction system and method of dielectric..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Record condition extraction system and method of dielectric... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3521106