Reconfigurable voltage inverter with tolerance to failures

Electric power conversion systems – Current conversion – With condition responsive means to control the output...

Reexamination Certificate

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Details

C363S096000, C363S056010, C363S057000

Reexamination Certificate

active

07436686

ABSTRACT:
Voltage inverter provided with four switching cells (Q1to Q4) to be connected to the terminals of a DC voltage source (Vdc), each comprising two semiconductor switches (I11, I12, I21, I22, I31, I32, I41, I42) installed in series, these switches having a common point (A0) to be connected to an AC current source (Mac) with three phases (p1, p2, p3) and a neutral (n), the connection being made onto one phase (p1, p2, p3) for three of the cells (Q1, Q2, Q3) and onto the neutral (n) for the fourth cell (Q4). Each cell (Q1to Q4) cooperates with a semiconductor electrical isolating device (S1, (S2.1and S2.2)) to be put into a turn-off state if the cell should fail, this isolating device (S1, (S2.1and S2.2)) being arranged either on the connection to the AC current source (Mac), or on connections to the terminals of the DC voltage source (Vdc).

REFERENCES:
patent: 5990654 (1999-11-01), Skibinski et al.
Brian A. Welchko, et al., “Fault Tolerant Three-Phase AC Motor Drive Topologies; A Comparison of Features, Cost, and Limitations”, Electric Machines and Drives Conferences, 2003., vol. 1, XP-010644859, Jun. 1, 2003, pp. 539-546.
R. L. A. Ribeiro, et al., “Compensation Strategies in the PWM-VSI Topology for a Fault Tolerant Induction Motor Drive System”, Symposium on Diagnostics for Electric Machines, Power Electronics and Drives, XP-010659931, Aug. 24-26, 2003, pp. 211-216.
Sangshin Kwak, et al., “A Matrix Converter for Fault Tolerant Strategies and Two-Phase Machine Drives”, IECON-2002. Proceedings of the 28th. Annual Conference of the IEEE Industrial Electronics Society, vol. 1 of 4, conf. 28, XP-010633166, Nov. 5, 2002, pp. 251-256.
N. Ertugrul, et al., “Investigation of a Fault Tolerant and High Performance Motor Drive for Critical Applications”, Institute of Electrical and Electronics Engineers, vol. 2 of 2, XP-001054005, Aug. 19, 2001, pp. 542-548.

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