Reconfigurable integrated circuit for enhanced testing in a manu

Details Reconfigurable integrated circuit for enhanced testing in a manu Reconfigurable integrated circuit for enhanced testing in a manu

1988-02-29

1989-03-28

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 73R, G01R 3128

Patent

active

048167576

ABSTRACT:
A reconfigurable circuit operating in a test mode and a normal operating mode includes a memory array (10) which has a row decoder (12) for addressing the memory elements therein. The row decoder (12) has a fused switch (18) for referencing the output circuits thereon to either a standard reference voltage or an external reference voltage. The memory array (10) has a fused switch (22) associated therewith for referencing the charging voltage for the memory cells to either the positive reference voltage in the circuit or to an external variable voltage. The fused switches (18) and (22) are operable to switch to internal references for the normal operating mode and to the external variable voltages for the test mode.

REFERENCES:
patent: 3242428 (1966-03-01), Brumley et al.
patent: 4494066 (1985-01-01), Goel et al.

Affiliated with

Also associated with

Rating

Reconfigurable integrated circuit for enhanced testing in a manu does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Reconfigurable integrated circuit for enhanced testing in a manu, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Reconfigurable integrated circuit for enhanced testing in a manu will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1661925