Reconfigurable connections for stacked semiconductor devices

Details Reconfigurable connections for stacked semiconductor devices Reconfigurable connections for stacked semiconductor devices

2007-10-16

2010-10-19

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010

Reexamination Certificate

active

07816934

ABSTRACT:
Some embodiments include apparatus, systems, and methods comprising semiconductor dice arranged in a stack, a number of connections configured to provide communication among the dice, at least a portion of the connections going through at least one of the dice, and a module configured to check for defects in the connections and to repair defects the connections.

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