Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2006-10-27
2008-08-12
Wachsman, Hal (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
C702S132000, C702S185000, C702S188000, C713S300000, C324S600000, C714S741000
Reexamination Certificate
active
07412346
ABSTRACT:
Apparatuses, methods, and systems associated with and/or having components capable of, detecting a temperature of an integrated circuit in real time during testing are disclosed herein. In exemplary embodiments, an integrated circuit includes a register to store a temperature limit for the integrated circuit; a temperature sensor formed on the integrated circuit to sense a temperature of the integrated circuit, and output a signal indicative of the temperature sensed, based at least in part on the temperature sensed; and testing logic coupled to the register and the temperature sensor to record a temperature violation if at any time during a testing mode of operation the temperature sensed by the temperature sensor violates the stored temperature limit.
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Bashir Mo S.
Krishnamoorthy Arun
Huynh Phuong
Intel Corporation
Schwabe Williamson & Wyatt P.C.
Wachsman Hal
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