Data processing: measuring – calibrating – or testing – Calibration or correction system
Reexamination Certificate
2007-12-04
2010-12-21
Cosimano, Edward R (Department: 2863)
Data processing: measuring, calibrating, or testing
Calibration or correction system
C073S865900, C324S537000, C702S104000, C702S182000, C702S187000, C702S189000
Reexamination Certificate
active
07856332
ABSTRACT:
A system and a method for effectively determining the measurement sensitivity, repeatability, and probe commonality to assist a test engineer determine if the tester meets the specified resolution at every test. A statistical measurement of inherent tester specifications are provided with the added accumulation of the probe contact resistance during the probing process. It further provides a feedback to the test probe card noise level while testing is in progress. Moreover, the system and the method determine the test probing integrity in-situ when testing integrated circuit chips or wafers, dynamically detecting probing errors, and modifying data associated with defective test probes.
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patent: 3082374 (1963-03-01), Buuck
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patent: 7612573 (2009-11-01), Kim et al.
patent: 7622940 (2009-11-01), Kim et al.
patent: 2007/0090851 (2007-04-01), Kim et al.
Karthikeyan Muthukumarasamy
Medina Louis V.
Song Yunsheng
Ting Tso-Hui
Wang Ping-Chuan
Cosimano Edward R
International Business Machines - Corporation
Schnurmann H. Daniel
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