Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2005-07-05
2005-07-05
Couso, Jose L. (Department: 2621)
Image analysis
Pattern recognition
Feature extraction
Reexamination Certificate
active
06915010
ABSTRACT:
The present invention provides a method for detecting an object. The method includes capturing a binary image of the object, and determining a projection of the binary image to a first axis. The method further includes determining a difference between a profile of a target object to the first axis and the projection at a plurality of positions along the first axis, and detecting the object by determining if the difference between the profile and the projection is less than a threshold at one of the plurality of positions.
REFERENCES:
patent: 3803553 (1974-04-01), Nakano et al.
patent: 5133020 (1992-07-01), Giger et al.
patent: 5640468 (1997-06-01), Hsu
Fang Ming
Neubauer Claus
Couso Jose L.
F. Chau & Associates LLC
Paschburg Donald B.
Siemens Corporate Research Inc.
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