Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1992-08-19
1995-06-27
Evans, F. L.
Optics: measuring and testing
By particle light scattering
With photocell detection
356349, 356359, 359846, G01B 9021
Patent
active
054284449
ABSTRACT:
A real time interferometric comparator apparatus. The apparatus generally includes means for projecting at least a first optical signal onto a complexly shaped surface such as a curved surface of a large reflector antenna of a satellite system, to thereby create an interferogram indicative of irregularities in the curvature of the reflector's surface. A scanning device scans the interferogram and transmits electrical signals in accordance with the scanned interferogram to a processing device which includes a comparator for comparing the scanned interferogram with a model or reference workpiece having a desired, or "perfect", surface. The processing device determines if any errors are present in the scanned interferogram and, if so, transmits error correction signals to an adjusting apparatus associated with the workpiece, to thereby provide a closed loop control system for continuously monitoring and correcting errors in the curvature of the workpiece such as the reflector antenna in real time. In alternative preferred embodiments holography is employed to generate the interferogram. The various preferred embodiments are particularly well adapted to aerospace applications and provide an extremely precise means for monitoring and controlling, in real time, the curvature of reflector antenna systems, as well as monitoring and controlling manufacturing operations, test operations, and analyzing operations.
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patent: 4093351 (1978-06-01), Perkins et al.
patent: 4536086 (1985-08-01), Shemwell
patent: 4725144 (1988-02-01), Nelson et al.
patent: 4925301 (1990-05-01), Rafanelli
Morrison, SPIE Journal, vol. 8, May 1970, pp. 107-118.
Gelb George H.
Haddock Loren B.
Evans F. L.
TRW Inc.
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