Real-time diffraction interferometer

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

356359, G01B 902

Patent

active

046245693

ABSTRACT:
A real-time diffraction interferometer for analyzing an optical beam comprises converging means (13) for bringing the beam to a focus at focal point (14), and an apertured grating structure (20) positionable adjacent the focal point (14). The apertured grating structure (20) comprises a transparent substrate (10'), an obverse surface of which is coated with a translucent coating (11) except for a pinhole-sized spot (12) that is left uncoated so as to function as an aperture in the coating (11). A reverse surface of the substrate (10') has a lenticulate surface configuration, which functions as a diffraction grating. The beam incident upon the apertured grating structure (20) is separated into a major portion, which is transmitted with attenuated intensity through the translucent coating (11), and a minor portion, which is transmitted with undiminished intensity through the pinhole aperture (12). The major portion of the beam is diffracted into spatially separated diffraction components, and the minor portion of the beam is diffracted by the pinhole aperture (12) so as to acquire a spherical wavefront. Interference patterns produced by interference of the spherical wavefront with each of the wavefronts of the zeroth order and the positive and negative first-order diffraction components of the intensity-attenuated beam transmitted by the coating (11) are separately imaged on conventional solid-state photodetectors (21, 22 and 23).

REFERENCES:
Smartt and Strong, "Point-Diffraction Interferometer", Abstract ThB12, JOSA, vol. 62, No. 5, p. 737, May 1972.
Smartt and Steel, "Theory and Application of Point-Diffraction Interferometers", Proc. ICO Conf. Opt. Methods in Sci. and Ind. Meas., Tokyo, pp. 351-356, 1974.
Koliopoulos et al., "Infrared Point-Diffraction Interferometer", Optics Letters, vol. 3, pp. 118-120, Sep. 1978.
Braning, Optical Shop Testing, John Wiley and Sons, pp. 409-437, 1978.
Quercioli et al., "Contrast Reversal With a Point-Diffraction Interferometer With a Carrier Frequency", Optics Comm., vol. 35, No. 3, 12/80, pp. 303-306.
Koliopoulos, "Interferometric Optical Phase Measurement Techniques", Doctoral Dissertation, U. of Arizona, 1981.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Real-time diffraction interferometer does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Real-time diffraction interferometer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Real-time diffraction interferometer will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1155913

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.