Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1983-07-18
1986-11-25
Willis, Davis L.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356359, G01B 902
Patent
active
046245693
ABSTRACT:
A real-time diffraction interferometer for analyzing an optical beam comprises converging means (13) for bringing the beam to a focus at focal point (14), and an apertured grating structure (20) positionable adjacent the focal point (14). The apertured grating structure (20) comprises a transparent substrate (10'), an obverse surface of which is coated with a translucent coating (11) except for a pinhole-sized spot (12) that is left uncoated so as to function as an aperture in the coating (11). A reverse surface of the substrate (10') has a lenticulate surface configuration, which functions as a diffraction grating. The beam incident upon the apertured grating structure (20) is separated into a major portion, which is transmitted with attenuated intensity through the translucent coating (11), and a minor portion, which is transmitted with undiminished intensity through the pinhole aperture (12). The major portion of the beam is diffracted into spatially separated diffraction components, and the minor portion of the beam is diffracted by the pinhole aperture (12) so as to acquire a spherical wavefront. Interference patterns produced by interference of the spherical wavefront with each of the wavefronts of the zeroth order and the positive and negative first-order diffraction components of the intensity-attenuated beam transmitted by the coating (11) are separately imaged on conventional solid-state photodetectors (21, 22 and 23).
REFERENCES:
Smartt and Strong, "Point-Diffraction Interferometer", Abstract ThB12, JOSA, vol. 62, No. 5, p. 737, May 1972.
Smartt and Steel, "Theory and Application of Point-Diffraction Interferometers", Proc. ICO Conf. Opt. Methods in Sci. and Ind. Meas., Tokyo, pp. 351-356, 1974.
Koliopoulos et al., "Infrared Point-Diffraction Interferometer", Optics Letters, vol. 3, pp. 118-120, Sep. 1978.
Braning, Optical Shop Testing, John Wiley and Sons, pp. 409-437, 1978.
Quercioli et al., "Contrast Reversal With a Point-Diffraction Interferometer With a Carrier Frequency", Optics Comm., vol. 35, No. 3, 12/80, pp. 303-306.
Koliopoulos, "Interferometric Optical Phase Measurement Techniques", Doctoral Dissertation, U. of Arizona, 1981.
Koren Matthew W.
Lockheed Missiles & Space Company Inc.
Morrissey John J.
Willis Davis L.
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