Real-time apparatus for detecting surface defects on objects

Details Real-time apparatus for detecting surface defects on objects Real-time apparatus for detecting surface defects on objects

1991-09-23

1993-12-28

Boudreau, Leo H.

Image analysis

Histogram processing

For setting a threshold

250563, 250572, 356237, 358106, G06K 900, H04N 718

Patent

active

052747131

ABSTRACT:
A real-time apparatus for detecting surface defects on a moving object under test comprises a high-frequency linear light source for generating linear light which is focused on a line position of the tested object, a linear CCD (charge coupled device) camera for scanning the line position and generating an image signal, an image-signal processing device for converting the analog image signal to digital image signal and further converting the digital signal to a HIGH or a LOW signal, a combination of the HIGH and LOW signals constituting constituting binary image data in the form of binary pulses, an image-storing circuit connected to the image-signal processing circuit for storing the binary image data, a defect-detecting unit for detecting if an area unit has a valid defect which meets one of a set of predetermined defect patterns or detecting statistical defects which are not valid defects but a plurality of small defects combined together still counted as defects, and a defect detecting statistic unit connected to the image-storing circuit for calculating a total amount of defect, and the area and location of each defect by a well-known connectivity analyzation process.

REFERENCES:
patent: 4758782 (1988-07-01), Kobayashi
patent: 4811410 (1989-03-01), Amir et al.
patent: 4975972 (1990-12-01), Bose et al.
patent: 5137362 (1992-08-01), Le Beau

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