Patent
1980-07-24
1982-10-05
Edlow, Martin H.
357 24, H01L 2714
Patent
active
043530842
ABSTRACT:
A monolithically integrated circuit for linear image scanning is coupled through clock pulse-supplied transfer gates to a number of readout charge transfer devices and has an overflow drain zone and an overflow gate disposed between the drain zone and the sensors connected to a clock pulse for selectively permitting transfer of charge between the sensors and the drain zone, with the sensors divided into groups representing image lines. The linear image scanning circuit operated by the interlacing method by which partial images are generated by different groups of sensors. The clock pulse controlling the overflow gate restricts the integration times of the various groups of sensors so that during the scanning of the partial images generated thereby, overlapping of the image data of one line of adjacent partial images is eliminated.
REFERENCES:
patent: 4242599 (1980-12-01), Suzuki
patent: 4242694 (1980-12-01), Koike et al.
D. T. Wright, "Solid State Sensors:The Use of a Single Dimension 512 Element Array for Film Scanning", BBC Report RD1973/32, (PH-113), Nov., 1973, pp. 1-17.
J. M. White and S. G. Chamberlain, "A Multiple-Gate CCD-Photodiode Sensor Element for Imaging Arrays", IEEE Transactions on Electron Devices, vol. ED-25, No. 2, Feb., (1978), pp. 125-131.
Herbst Heiner
Niemeyer Matthias
Carroll J.
Edlow Martin H.
Siemens Aktiengesellschaft
LandOfFree
Readout circuit for a monolithically integrated circuit for line does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Readout circuit for a monolithically integrated circuit for line, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Readout circuit for a monolithically integrated circuit for line will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-425280