Read/write tip, head and device, and use thereof, and method...

Dynamic information storage or retrieval – Specific detail of information handling portion of system – Electrical modification or sensing of storage medium

Reexamination Certificate

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Reexamination Certificate

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08040784

ABSTRACT:
The invention concerns a reading/writing tip configured in the shape of a needle consisting of a core of refractory material covered with a coating of electrically conductive material, and having an outer microscope needle geometry by tunnel effect, to obtain an information concerning a surface through tunnel-effect microscopy The needle emits a charged particle from the layer of electrically conductive material, to form the surface. The tip comprises a reservoir capable of being liquefied to flow along the tip.

REFERENCES:
patent: 4774413 (1988-09-01), Okubo et al.
patent: 5689494 (1997-11-01), Ichikawa et al.
patent: 0431623 (1991-12-01), None
patent: WO 96/02065 (1996-01-01), None
Van Es, et al., An improved gallium liquid-metal ion source geometry for nanotechnology, Microelectronic Engineering 73-74, (2004); p. 132-138, cited in the application.
Culbertson, et al., Atom-probe field-ion microscopy of a high intensity gallium ion source, Journal of Vacuum Science & Technology, 17(1), Jan./Feb. 1980, © 1980 American Vacuum Society pp. 203-206.
Binnig, et al., Scanning tunneling microscopy-from birth to adolescence, Review of Modem Physics, vol. 59, No. 3, Part 1, Jul. 1987.
French Preliminary Search report for the priority French application.
Wagner, et al. Liquid gold ion source, Journal of Vacuum Science and Technology, vol. 16, No. 6, November 79, pp. 1871-1874.
Gupalo, et al., Dual scanning tunneling microscope mode of the surface diffusion metal ion source: Li transfer and scanning, Journal of Vacuum Science & Technology B (Microelectronics and Nanometer Structures) AIP for American Vacuum Society USA, Vo. 15, No. 2, Mar./Apr. 1997, pp. 491, 493-494.
Notification of Transmission of the International Research Report, European Office, Form PCT/ISA/220 (Oct. 2005).
European Office Written Opinion, Form PCT/ISA/237, Apr. 2005.
International search report for the international application, Form FR237, Jan. 2006.
Purcell, et al., Atomic-size metal-ion sources: principles and use, , Institute of Physics publishing nanotechnology, 2001, pp. 168-172.

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