Reactive sputter etching apparatus

Chemistry: electrical and wave energy – Apparatus – Coating – forming or etching by sputtering

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204192E, C23C 1500

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active

043092675

ABSTRACT:
An rf sputter etch or reactive sputter etch apparatus which can be used for etching substrates at oblique angles utilizes a cathode formed from a metal grid and an equipotential enclosure. The substrate is supported in the enclosure either parallel to or at an oblique angle to the surface of the grid.

REFERENCES:
patent: 3526584 (1970-09-01), Shaw
patent: 3730873 (1973-05-01), Pompei et al.
patent: 3943047 (1976-03-01), Cruzan et al.
patent: 4131506 (1976-12-01), Namba et al.
Y. Budo et al., "Multiusage of Sputter & Sputter Etch", IBM Tech. Discl. Bull., vol. 15, p. 1695 (1972).
S. Somekh, "Introduction to Ion & Plasma Etching", J. Vac. Sci. Tech., vol. 13, pp. 1003-1007 (1976).
S. Somekh et al., "Dry Processing of High Resolution & High Aspect Ratio Structures Inc GaAs-Al.sub.x Ga.sub.1-x As For Integrated Optics", Applied Optics, vol. 16, pp. 126-136, (1977).
H. W. Lehmann et al., "Profile Control by Reactive Sputter Etching", J. Vac. Sci. Tech., vol. 15, pp. 319-326 (1978).
G. D. Boyd et al., "Directional Reactive Ion Etching at Oblique Angles", Appl. Phys. Lett., vol. 36, pp. 583-585 (1980).

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