Re-calculating S-parameter error terms after modification of...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters

Reexamination Certificate

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C324S639000, C324S601000

Reexamination Certificate

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11394686

ABSTRACT:
A two-port S-parameter calibration between a first port and a second port of a test system having a multi-port vector network analyzer is performed to provide a first S-parameter calibration of the test system. A transfer device is connected between the first and second ports of the test system. A port of the test system is changed to provide a second state of the test system, and a plurality of ratioed un-corrected parameters of the transfer device are measured with the test system in the second state. A second S-parameter calibration of the test system in the second state is determined using the ratioed un-corrected parameters and S-parameter data.

REFERENCES:
patent: 5748000 (1998-05-01), Blackham
patent: 6081125 (2000-06-01), Krekels et al.
patent: 6836743 (2004-12-01), Blackham et al.
patent: 2004/0160228 (2004-08-01), Jamneala et al.
Jargon and Marks, Two-Tier Multiline TRL for Calibration of Low-Cost Network Analyzers, 46th ARFTG Conference Digest, pp. 1-8 (Dec. 1995).
Marks, Formulations of the Basic Vector Network Analyzer Error Model Including Switch Terms, 50th ARFTG Conference Digest, pp. 115-126 (Dec. 1997).
Ferrero and Pisani, QSOLT: A New Fast Calibration Algorithm for Two Port S Parameter Measurements, 38th ARFTG Conference Digest, pp. 15-21 (Dec. 1991).
U.S. Appl. No. 11/028,159, entitled Method For Implementing TRL Calibration in VNA, filed Jan. 3, 2005 by Kenneth H. Wong, David V. Blackham, James Llu, and Kieth F. Anderson.
U.S. Appl. No. 11/028,032, entitled Multiport Calibration Simplification Using the “Unknown Thru” Method, filed Jan. 3, 2005 by Keith F. Anderson, David V. Blackham, Brad R. Hokkanen, adn Kenneth H. Wong.
U.S. Appl. No. 11/127,852, entitled Power Calibration for Multi-Port Vector Network Analyzer (VNA), filed May 12, 2005 by Robert E. Shoulders, David V. Blackham, and Kenneth H. Wong.

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