RC-timer circuit to reduce current leakage in future...

Details RC-timer circuit to reduce current leakage in future... RC-timer circuit to reduce current leakage in future...

2003-01-21

2004-09-21

Sircus, Brian (Department: 2836)

Electricity: electrical systems and devices

Safety and protection of systems and devices

Load shunting by fault responsive means

C361S111000

Reexamination Certificate

active

06795286

ABSTRACT:

BACKGROUND
1. Field
This disclosure relates to timer circuits, and, more particularly, to resistive-capacitive (RC) timer circuits.
2. Background Information
Advancements in silicon processing technologies employed to manufacture integrated circuits (ICs) may include, for example, reduction in circuit element sizes. Such reduction in circuit element sizes is one way the performance of such ICs may be improved and may be referred to as “scaling.” Those of skill in the art would be aware that current silicon processing technologies have circuit element dimensions, such as transistor sizes, which are smaller than 200 nano-meters (nm). Such processes are typically referred to as “sub-micron” processes.
Such scaling, typically, has not had any significant adverse effects on the performance of most circuit designs, that is, circuit designs, historically, have typically required little modification to maintain functionality from one process generation to the next other than scaling such circuits in a corresponding manner with such process advancements. However, as further advancements are made in the area of sub-micron processes, the effects of such scaling, such as parasitics, for example, may become more pronounced. Parasitics, as they are typically referred to by those of skill in the art, in this context, may be defined as non-ideal, or intrinsic electrical characteristics of circuits embodied in such an IC. Such intrinsic characteristics may comprise, for example, capacitance, resistance and leakage currents. However, in future process generations, these factors may result in such circuits no longer working as intended by merely scaling the circuit elements in a manner corresponding with that process' advancements. Therefore alternative embodiments of such circuits may be desired.


REFERENCES:
patent: 5629545 (1997-05-01), Leach
patent: 5719737 (1998-02-01), Maloney
patent: 5770969 (1998-06-01), Walls et al.
patent: 5789964 (1998-08-01), Voldman
patent: 5828259 (1998-10-01), Cases et al.
patent: 5835328 (1998-11-01), Maloney et al.
patent: 5838146 (1998-11-01), Singer
patent: 5892381 (1999-04-01), Koifman et al.
patent: 5907464 (1999-05-01), Maloney et al.
patent: 5940258 (1999-08-01), Duvvury
patent: 5946177 (1999-08-01), Miller et al.
patent: 5956219 (1999-09-01), Maloney
patent: 6008970 (1999-12-01), Maloney et al.
patent: 6084464 (2000-07-01), Lin
patent: 6307250 (2001-10-01), Krauter et al.
patent: 6510033 (2003-01-01), Maloney et al.
patent: 6556408 (2003-04-01), Zhang

Affiliated with

Also associated with

Rating

RC-timer circuit to reduce current leakage in future... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with RC-timer circuit to reduce current leakage in future..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and RC-timer circuit to reduce current leakage in future... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3260182