Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1999-02-04
1999-10-19
Kim, Robert H.
Optics: measuring and testing
By particle light scattering
With photocell detection
356338, 356341, G01N 2100, G01N 2121
Patent
active
059698144
ABSTRACT:
A rate nephelometer of the type useful in automated chemical analyzers is provided. The nephelometer includes a laser for generating a polarized laser beam having an S-wave component and a P-wave component. The beam is split by a beam splitter specially constructed so that a known proportion of one of the two polarized portions of the beam is directed to a reaction container. In the reaction container, a first polarized component of the laser beam is used in a nephelometric chemical analysis. The remainder of the laser beam passes through the beam splitter to a laser control light detector. Before the remainder of the laser beam reaches the laser control light detector, however, the polarized component which is not used in nephelometric chemical analysis is filtered out. The laser control detector uses the non-filtered portion of the laser beam to control the output of the laser.
REFERENCES:
patent: 4835110 (1989-05-01), Seymour et al.
patent: 5082790 (1992-01-01), Theobald et al.
patent: 5296195 (1994-03-01), Pang et al.
patent: 5863506 (1999-01-01), Farren
Barber Duane G.
Tu Songtai
Watts Richard P.
Beckman Coulter Inc.
Kim Robert H.
Kivinski Margaret A.
Lauchman Layla
May William H.
LandOfFree
Rate nephelometer does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Rate nephelometer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Rate nephelometer will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2063170