Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-07-04
2006-07-04
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S066000, C702S077000, C702S079000, C324S12100R, C324S115000, C324S345000, C324S440000, C324S661000
Reexamination Certificate
active
07072785
ABSTRACT:
A method and apparatus for processing anomalous trigger event conditions to provide anomalous trigger event rate measurements. The apparatus operates to identify one or more trigger events in at least one input signal IN, determine the number of events during a period of time (e.g. events per second) and provide a visual representation of this determination to a user via a display device. The visual representation may comprise an alphanumeric display, a waveform, a graphic image proximate a waveform and the like.
REFERENCES:
patent: 5155431 (1992-10-01), Holcomb
patent: 6571185 (2003-05-01), Gauland et al.
patent: 6892150 (2005-05-01), Pickerd et al.
patent: 2004/0124848 (2004-07-01), Tran et al.
De Lacy John C.
Smith Patrick A.
Bui Bryan
Lenihan Thomas F.
Moser,Patterson,Sheridan LLP
Tektronix Inc.
Vo Hien
LandOfFree
Rate measurement for anomalous trigger events does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Rate measurement for anomalous trigger events, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Rate measurement for anomalous trigger events will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3591544