Raster scan control system for a charged-particle beam

Radiant energy – With charged particle beam deflection or focussing – Magnetic lens

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

250397, 250398, H01J 314, G01K 108

Patent

active

050177893

ABSTRACT:
A raster scan control system (18) for use with a charged-particle beam delivery system (20) provides precise control of large currents driving an inductive load. The beam delivery system includes a nozzle through which a charged-particle beam (24), such as a proton beam, passes prior to being directed to a target (32). The nozzle includes both fast and slow sweep scan electromagnets (204, 208) that cooperate to generate a sweeping magnetic field that steers the beam along a desired raster scan pattern at the target. The electromagnets are driven by large currents (213, 215) from the raster scan control system. The raster scan control system includes both fast and slow power amplifiers (212, 214) for delivering the desired large currents to the fast and slow electromagnets, respectively; monitoring means (206, 210) for monitoring the magnetic fields; sensing means (212, 230) for sensing the large currents; feedback means for maintaining the magnetic fields and large current at desired levels; out of tolerance means for automatically causing the servo power amplifiers to steer the beam away from the target area in the event the error signal becomes excessive; a programmable raster generator (80) for providing the fast and slow power amplifiers with a raster scan signal (216, 218) that defines the desired raster pattern; and a power supply (74) for delivering the requisite power to the power amplifiers and other components.

REFERENCES:
patent: 4198565 (1980-04-01), Ono
patent: 4380703 (1983-04-01), Schmitt
patent: 4705955 (1987-11-01), Mileikowsky
patent: 4812658 (1989-03-01), Koehler
patent: 4845370 (1989-07-01), Thompson et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Raster scan control system for a charged-particle beam does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Raster scan control system for a charged-particle beam, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Raster scan control system for a charged-particle beam will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-240352

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.