Rapid thermal processing apparatus and method of manufacture...

Electric resistance heating devices – Heating devices – Radiant heater

Reexamination Certificate

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C219S395000

Reexamination Certificate

active

07844171

ABSTRACT:
A rapid thermal processing apparatus comprises a processing chamber which subjects a semiconductor substrate to rapid thermal processing. A substrate support part is arranged in the processing chamber and supports the substrate. A lamp part optically irradiates the substrate supported by the substrate support part and heats the substrate. A thermo sensor is provided to measure a temperature of the substrate. A temperature computing part computes the temperature of the substrate based on an output signal of the thermo sensor. A control part controls an irradiation intensity of the lamp part according to the temperature computed by the temperature computing part. In this apparatus, the control part is provided to correct a control parameter of the irradiation intensity of the lamp part based on a measured reflectivity of a surface of the substrate.

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Office Action dated Oct. 20, 2009 corresponding to Japanese patent application No. 2004-244051 with English translation.
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Office Action dated Aug. 3, 2010 issued in Japanese patent application No. 2004-284592 with English translation.

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