Rapid temperature cycling for accelerated stress testing

Details Rapid temperature cycling for accelerated stress testing Rapid temperature cycling for accelerated stress testing

1993-06-01

1994-06-07

Gutierrez, Diego F. F.

Thermal measuring and testing

Thermal testing of a nonthermal quantity

Of susceptibility to thermally induced deteriouration, flaw,...

62 33, 738656, G01N 2500, G01N 2572, G01N 360, G01N 1700

Patent

active

053183614

ABSTRACT:
An environmental testing chamber (10) and thermal cycling method in which, in addition to stressing the device (20) under test with electrical bias (32), elevated temperature (12), pressure (16), and humidity (18) while the device is being monitored (32), a thermoelectric heat pump (26) quickly cycles the temperature of the device by pumping heat from the heat sink (22) mounting the device to another larger heat sink (24).

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Gunn, J. et al., "Highly Accelerated Temperature and Humidity Stress Test Technique (HAST)", Reliability Physics 19th Annual Proceedings, Orlando, Fla., (Apr. 7-9, 1981), 1981 IEEE/IRPS, pp. 48-51.
Thermal Shock, MIL-STD-883C, Notice 12, Method 1011.9, Paragraph 3.1, Jul. 27, 1990, pp. 1-3.

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