Optics: measuring and testing – By dispersed light spectroscopy – With synchronized spectrum repetitive scanning
Patent
1978-02-02
1980-09-30
Evans, F. L.
Optics: measuring and testing
By dispersed light spectroscopy
With synchronized spectrum repetitive scanning
356334, G01J 318, G01J 342
Patent
active
042252334
ABSTRACT:
A spectrometer capable of providing a predetermined wavelength of output light in accordance with a control voltage signal applied to a scanning element is described. The scanning element located at the grating image of the spectrometer is a small mirror attached to the rotor of a galvanometer whose angular position is accurately controlled by a closed-loop electronic control. The spectrum reflected from the mirror is passed through a slit to provide the output light of a predetermined wavelength. Selection of the waveform of the control signal allows the spectrometer to be operated as a dual wavelength spectrometer, to use a linear wavelength scan, or other wavelength scan patterns for absorbance analyses of a sample. The rapid scan capability of this instrument has been utilized to extend the measurement of absorbance changes at one wavelength, corrected for light scattering changes (dual-wavelength spectroscopy), to the measurement of the complete differential absorbance spectrum, similarly corrected for light scattering changes (corrected-differential spectroscopy).
REFERENCES:
patent: 4070111 (1978-01-01), Harrick
Ogan et al., Review of Scientific Instruments, vol. 48, No. 2, Feb. 1977, pp. 142-147.
Bonfiglioli et al., Applied Optics, vol. 3, No. 12, Dec. 1964, pp. 1417-1424.
Bonfiglioli et al., Applied Optics, vol. 6, No. 3, Mar. 1967, pp. 447-455.
Strojeck et al., Analytical Chemistry, vol. 41, No. 3, Mar. 1969, pp. 481-484. _
Evans F. L.
Santa Martin M.
The Trustees of Boston University
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