Fishing – trapping – and vermin destroying
Patent
1992-02-21
1993-10-05
Hearn, Brian E.
Fishing, trapping, and vermin destroying
437937, 437247, 148DIG128, H01L 21324
Patent
active
052504441
ABSTRACT:
A method for rapid plasma hydrogenation of semiconductor devices is provided in which the hydrogenation is conducted in two steps, the first step being conducted at a hydrogenation temperature that is higher than the out-diffusion temperature at which a substantial amount of hydrogen diffuses out of said semiconductor device; and in the second step, the semiconductor device is cooled to a temperature at which out-diffusion is substantially avoided while the hydrogenation plasma is maintained.
REFERENCES:
patent: 4113514 (1978-09-01), Pankove et al.
patent: 4315782 (1982-02-01), Tarng
patent: 4331486 (1982-05-01), Chenevas-Paule et al.
patent: 4605447 (1986-08-01), Brotherton et al.
patent: 4943837 (1990-07-01), Konishi et al.
patent: 5112764 (1992-05-01), Mitra et al.
Campbell et al, Enhanced Conductivity in Plasma-Hydrogenated Polysilicon Films, Appl. Phys. Lett., 36, (7) pp. 604-606, Apr. (1980).
Hasegawa et al, Plasma-Hydrogenation Effects on Conductivity and Electron Spin Resonance in Undoped . . . , J. Appl. Phys., 53 (7) pp. 5022-5026, Jul. (1982).
Kamins, Electrical Properties of Polycrystalline-Silicon Thin Films, Proceedings of the Fifth . . . , 1986, pp. 235-249, (1986).
Nazakawa et al, Mechanism of a Hydrogenating Polycrystalline Silicon in Hydrogen Plasma Annealing, Appl. Plys., Lett., 51 (20) pp. 1623-1625, Nov. (1987).
Rodder et al, Utilization of Plasma Hydrogenation in Stacked SRAM's with Poly-Si PMOSFET's and . . . , IEEE Electron Device Letters, vol. 12, No. 5, pp. 233-235, May, 1991.
Wu et al, Passivation Kinetics of Two Types of Defects in Polysilicon TFT . . . IEEE Electron Device Letters, vol. 12, No. 4, pp. 181-183, Apr. 1991.
Mitra et al, Mechanism of Plasma Hydrogenation of Polysilicon . . . J. of the Electrochemical Society, vol. 138, No. 11, pp. 3420-3424, Nov. 1991.
Khan Babar
Mitra Uday
Rossi Barbara A.
Bartlett Ernestine C.
Chaudhari C.
Hearn Brian E.
North American Philips Corporation
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