Random initialization of latches in an integrated circuit...

Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Circuit simulation

Reexamination Certificate

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Reexamination Certificate

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08000950

ABSTRACT:
Latches in a net of a simulated integrated circuit design are initialized to known logical states prior to application of a reset signal at the beginning of the simulation. The logical states may be set by generating a list of the latches, sorting them in random order, and then dividing them into two groups based on the random order with high and low logical states respectively assigned to the two groups. In a specific implementation the latch states are set using an HDL force command prior to applying the reset signal, and the force command is removed after applying the reset signal using an HDL release command. If the circuit description is a gate-level netlist, then logical states of gates within the storage elements are also set.

REFERENCES:
patent: 5870316 (1999-02-01), Gilbert et al.
patent: 6061819 (2000-05-01), Bening et al.
patent: 6845479 (2005-01-01), Illman
patent: 7024345 (2006-04-01), Stamm et al.
patent: 7251794 (2007-07-01), Blanco et al.
patent: 2005/0222832 (2005-10-01), Smith et al.
patent: 2007/0260433 (2007-11-01), Seki
William K. Lam, “Hardware Design Verification: Simulation and Formal Method-based Approaches”, 2005, Prentice Hall, pp. 1-6.
Mike Turpin, “The Dangers of Living with an X (bugs hidden in your Verilog)”, 2003, Synopsys Users Group Meeting, pp. 1-34.
Lionel Bening, “A two-state methodology for RTL logic simulation”, 1999, Proceedings of the 36th annual ACM/IEEE Design Automation Conference, six pages.
F. Corno et al., “A new approach for initialization sequences computation for synchronous sequential circuits”, 1997, IEEE International Conference on Computer Design: VLSI in Computers and Processors, pp. 381-386.
Samir Palnitkar, “Verilog HDL A Guide to Digital Design and Synthesis”, 1996, Sun Microsystems, p. 171.
IBM Technical Disclosure Bulletin, “Orthogonal Test Pattern Generator,” v. 38, n. 3, pp. 201-204 (Mar. 1995).

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