Optics: measuring and testing – Crystal or gem examination – Axes determination
Patent
1988-01-13
1989-02-07
Evans, F. L.
Optics: measuring and testing
Crystal or gem examination
Axes determination
356301, G01J 344, G01N 2165
Patent
active
048027600
ABSTRACT:
A Raman microprobe apparatus for determining crystal orientation comprises a polarizer for polarizing not only incident light but also Raman light. The polarizer is provided between a half mirror for deflecting the incident light toward a specimen and an object lens system for focusing the incident light on the specimen.
REFERENCES:
Journal of Applied Physics, "Raman Microprobe Determination of Local Crystal Orientation", by J. B. Hopkins et al, pp. 1103-1110, Feb. 15, 1986.
Ikeda Takeshi
Inoue Yasuo
Evans F. L.
Mitsubishi Denki & Kabushiki Kaisha
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