Radiant energy – Invisible radiant energy responsive electric signalling – Semiconductor system
Patent
1989-04-24
1991-01-08
Hannaher, Constantine
Radiant energy
Invisible radiant energy responsive electric signalling
Semiconductor system
250253, 250255, 25037001, 357 29, G01T 102, H01L 31115
Patent
active
049838431
ABSTRACT:
A radon gas detector instrument comprising: a filter for trapping alpha radon daughters of said gas, an air pump for drawing ambient air through the filter, a DRAM devoid of an alpha particle barrier layer, located adjacent the filter, for exposure to alpha particles trapped by the filter, apparatus for cyclically relaxing all cells of the DRAM, waiting for a significant period of time for cells of the DRAM to become charged by said alpha particles, then reading the DRAM to determine the number of charged cells in the DRAM, a display connected to the relaxing, waiting and reading means for displaying a count of the number of charged cells in units correlated to the intensity of radon gas in the ambient air.
REFERENCES:
patent: 4641165 (1987-02-01), Iizuka et al.
patent: 4680471 (1987-07-01), Morris et al.
A.K.M.M. Haque, J. Yates and D. Stevens, "Soft Errors in Dynamic Random Access Memories--A Basis For Dosimetry." Published by Polytechnic of the South Bank, London, England SE1OAA, (Unknown date), Abstract, pp. 1-12 and 4 figures.
J.C. Lund, F. Sinclair and G. Entine, "Neutron Dosimeter Using a Dynamic Random Access Memory as a Sensor," IEEE Transactions on Nuclear Science, vol. 33, No. 1 (Feb. 1986), pp. 620-623.
Patrick J. Winters, "The Radiation Soft Dynamic RAM as a Particle Detector," IEEE Nuclear Science Symposium (Oct. 1982).
IS256 OpticRAM.TM. 262,144 Element Solid-State Image Sensor, Published by Micron Technology, Inc., Boise, Idaho, Rev. 2 (effective 3-1-86).
J. Bigu and R. Raz, "Passive Radon/Thoron Personal Dosimeter Using an Electrostatic Collector and a Diffused-Junction Detector," Review of Scientific Instruments, vol. 58, No. 1 (Jan. 1985), pp. 146-153, Copyright.COPYRGT. 1985 American Institute of Physics.
Timothy C. May and Murray H. Woods "Alpha-Particle-Induced Soft Errors in Dynamic Memories", IEEE Transactions on Electron Devices, vol. ED-26, No. 1 (Jan. 1979), pp. 2-9.
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