X-ray or gamma ray systems or devices – Beam control
Patent
1994-05-31
1996-01-09
Church, Craig E.
X-ray or gamma ray systems or devices
Beam control
378 58, G21K 100
Patent
active
054835712
ABSTRACT:
A method for the x-ray inspection of materials making use of the Moire effect is described. The Moire effect results when two patterns are superimposed, a third pattern is produced. Any change in either of the first two patterns creates a change in the third. Moire inspection is common with visible light, this invention allows the technique to be extended to locations inaccessible to visual inspection. A first pattern of high radio contrast material is attached to or included in the sample. X-rays are projected through the sample. A second pattern is imposed at the observation point, either before or after the formation of the x-ray image. The two patterns interact to create a third, Moire, pattern. As the material is stressed the Moire pattern changes, the degree of change indicating the degree of stress.
REFERENCES:
patent: 3621246 (1971-11-01), Horsey
patent: 3728542 (1973-04-01), Golfier
patent: 4688240 (1987-08-01), Hosemann et al.
patent: 5125016 (1992-06-01), Korhonen et al.
patent: 5432349 (1995-07-01), Wood et al.
Church Craig E.
Helfrich George F.
Perez Robert C. F.
The United States of America as represented by the Administrator
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