Radiant energy – Invisible radiant energy responsive electric signalling – Semiconductor system
Reexamination Certificate
2011-01-04
2011-01-04
Porta, David P (Department: 2884)
Radiant energy
Invisible radiant energy responsive electric signalling
Semiconductor system
C250S363070, C382S132000, C382S275000
Reexamination Certificate
active
07863575
ABSTRACT:
A radiographic imaging method and system use a radiation solid state detector or a flat panel detector (FPD). The method and system enable radiographic imaging to be continued for a while after occurrence of pixel defects that may lower image quality and minimizing adverse effects of the pixel defects. The pixel defects are analyzed in the respective local regions on the detector. A pixel defect correction is not made on local regions where the pixel defect exceeds a given tolerance but these regions are marked on the radiographic image for recognition.
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FUJIFILM Corporation
Malevic Djura
Porta David P
Sughrue & Mion, PLLC
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