Radiation thermometry

Thermal measuring and testing – Temperature measurement – In spaced noncontact relationship to specimen

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374128, 374134, 374 9, 356 45, G01J 552

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active

048818232

ABSTRACT:
A method of determining true temperatures of a heated target material by its radiation based on prior knowledge of an emissivity function which describes the relationship between two spectral emissivities for the target material, comprising measuring two radiances corresponding to said two spectral emissivities from the target material, assuming a temperature of the target material, then calculating a pair of emissivities which satisfy the emissivity fuction whereat the assumed temperature is the true temperature of the target material.

REFERENCES:
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patent: 3611805 (1971-10-01), Hishikari
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patent: 4020695 (1977-05-01), Roney
patent: 4172383 (1979-10-01), Iuchi
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patent: 4561786 (1985-12-01), Anderson
patent: 4579461 (1986-04-01), Rudolph
patent: 4708493 (1987-11-01), Stein
Tskhai, N. S., "Spectral Method of Determining the Emissivity of Hot Surfaces", J. Appl. Spectrose (USA) vol. 27, No. 3, (Sep. 1977)(Publ 3-78), 1111-1115.
Barber & Brown, "Establishing a Calibration Laboratory for Industrial Radiation Thermometry, " Applications of Radiation Thermometry ASTM STP 895, Richmond & DeWitt, Eds., Philadelphia, 1985, pp. 39-60.
Anderson, "Methods of Calibration at a National Laboratory," Applications of Radiation Thermometry ASTM STP 895, Richmond & DeWitt, Eds., Philadelphia, 1985, pp. 24-38.

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