Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices
Reexamination Certificate
2007-08-28
2007-08-28
Nguyen, Kiet T. (Department: 2881)
Radiant energy
Irradiation of objects or material
Irradiation of semiconductor devices
C250S50400H, C378S034000
Reexamination Certificate
active
11292310
ABSTRACT:
A radiation system for generating a beam of radiation is disclosed. The radiation system includes a pulsed EUV source for generating EUV radiation, and a spectral filter mounted in front of the EUV source for selectively passing a spectral range of a beam of EUV radiation from the EUV source. The spectral filter is mounted on a movable mount configured to be moved in synchronicity with the pulsed EUV source to prevent debris traveling from the EUV source from impacting the spectral filter. Accordingly, the spectral filter is kept substantially free from contamination by the debris.
REFERENCES:
patent: 4408338 (1983-10-01), Grobman
patent: 7098466 (2006-08-01), Chandhok et al.
patent: 2002/0001363 (2002-01-01), Kondo
patent: 2006/0245044 (2006-11-01), Apetz et al.
patent: 1 274 287 (2003-01-01), None
patent: 1 349 010 (2003-10-01), None
patent: 1 396 758 (2004-03-01), None
patent: 2004027842 (2004-04-01), None
European Search Report issued in EP Application NO. 06 07 7059 dated May 3, 2007.
Klunder Derk Jan Wilfred
Moors Johannes Hubertus Josephina
Van Herpen Maarten Marinus Johannes Wilhelmus
ASML Netherlands B.V.
Nguyen Kiet T.
Pillsbury Winthrop Shaw & Pittman LLP
LandOfFree
Radiation system and lithographic apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Radiation system and lithographic apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Radiation system and lithographic apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3874278