Radiation microscope

Details Radiation microscope Radiation microscope

1992-12-08

1994-07-19

Porta, David P.

Optical: systems and elements

Having significant infrared or ultraviolet property

359352, 250372, H01J 314

Patent

active

053314565

ABSTRACT:
An X-ray microscope is equipped with an X-ray source generating radiation including X rays ranging in wavelength from 400 to 600 .ANG., a beam splitter composed of a thin film which reflects a part of the X rays from the X-ray source and transmits the remainder, an objective, and an X-ray detector. Thus, the X-ray microscope allows the reflected radiation from an sample to be observed in a soft X-ray region, and enables high resolution microscopy even in a thick sample.

REFERENCES:
patent: 5225671 (1993-07-01), Fukuyama
Radioshack, "Dictionary of Electronics", 1978-1979, p. 784.

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