Radiation induced single event latchup protection and recovery o

Details Radiation induced single event latchup protection and recovery o Radiation induced single event latchup protection and recovery o

1997-02-25

2000-05-16

Gaffin, Jeffrey

Electricity: electrical systems and devices

Safety and protection of systems and devices

Transient responsive

H01L 2178

Patent

active

060645555

ABSTRACT:
An apparatus is disclosed for improving the Single Event Latchup (SEL) performance of an integrated circuit device (IC), or grouping of devices (as an example Multi-Chip Modules or MCMs), through the addition of active electronic circuitry integrated within the IC or MCM package. This circuitry and the protected device can be incorporated within the same physical dimensions and electrical configuration as the original integrated circuit device. The circuitry turns a destructive Latchup of a device into a recoverable event, allowing electronic devices that where unsuitable for the space environment due to SEL to be useable in the space environment.

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patent: 5672918 (1997-09-01), Kimbrough et al.
M.P. Baze et al., "Latchup Paths in Bipolar Integrated Circuits", IEEE Transaction on Nuclear Science, Dec. 1986, vol. NS-33. No. 6.
A.H. Johnston, et al., "The Effect of Temperature on Single-Particle Latchup", IEEE Transaction on Nuclear Science, Dec. 1991, vol. 38, No. 6.
Song et al., "Parametric Investigation of Latch-Up Sensitivity in 1.25 .mu.m CMOS Technology", IEEE Transactions on Nuclear Science, Dec. 1987, vol. NS-34 No. 6.

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