Radiation image detection apparatus, residual charge amount...

Details Radiation image detection apparatus, residual charge amount... Radiation image detection apparatus, residual charge amount...

2008-03-31

2010-02-02

Porta, David P (Department: 2884)

Radiant energy

Invisible radiant energy responsive electric signalling

Semiconductor system

Reexamination Certificate

active

07655917

ABSTRACT:
A residual charge amount estimation method including the steps of: providing a radiation image detector including pixels, scanning lines, and data lines, each pixel having a collection electrode, a capacitor, and a TFT switch; detecting a leak current flowing out through each data line with the TFT switches being switched OFF; reading out an image signal flowing out through each data line by sequentially switching ON the TFT switches connected to each scanning line on a scanning line-by-scanning line basis; calculating an average leak current per unit saturated pixel from the leak current detected from at least one of the data lines on which a saturated pixel having a saturated value of the image signal is found and the number of saturated pixels; and estimating the amount of residual charges remaining in the unit saturated pixel based on the average leak current.

REFERENCES:
patent: 6342700 (2002-01-01), Izumi et al.
patent: 2003-10159 (2003-01-01), None
MacQuigg, “Residual Charge on a Switched Capacitor,” 1983, IEEE Journal of Solid-State Circuits, vol. SC-18, No. 6, pp. 811-813.
Ito et al., “Leak current characterization in high frequency operation of CMOS circuits fabricated on SOI substrate,”, 1995, Proceedings of IEEE international conference on microelectronic test structures, vol. 8, pp. 67-70.

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