Radiation field analyzer using interference patterns

Details Radiation field analyzer using interference patterns Radiation field analyzer using interference patterns

1997-11-12

1999-06-29

Turner, Samuel A.

Optics: measuring and testing

By particle light scattering

With photocell detection

356351, 324 7621, G01B 902

Patent

active

059175966

ABSTRACT:
A radiation field analyzer (10) provides means for analyzing the spatial mode spectrum of radiation received from a scene. In a multimode waveguide embodiment, light from a laser (24) is directed towards a scene through an alumina waveguide structure (12). A portion of the laser light is directed towards a mode generator (28) which selectively converts the laser radiation into one of a series of modes. Laser light returning from the scene is mixed with the light from the mode generator to produce interference signals. These signals are measured by a detector (34) and analyzed by a programmed computer (36). By sequentially altering the mode generated by the generator (28) and analyzing the resulting signals, a spectrum of the modes returning from the scene is obtained.

REFERENCES:
patent: 5689335 (1997-11-01), Strauss

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