Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2006-05-11
2009-12-22
Mariam, Daniel G (Department: 2624)
Image analysis
Pattern recognition
Feature extraction
C382S132000
Reexamination Certificate
active
07636476
ABSTRACT:
A radiation area extracting method for extracting a radiation area from image data includes generating combinations of at least two candidate lines from an area of the image data, an evaluating step of obtaining evaluated values of the combinations of at least two candidate lines, and an extracting step of extracting one of the combinations of at least two candidate lines as a contour line of the radiation area on the basis of the evaluated values.
REFERENCES:
patent: 4967079 (1990-10-01), Shimura
patent: 4992663 (1991-02-01), Takeo
patent: 5732149 (1998-03-01), Kido et al.
patent: 6356651 (2002-03-01), Murakami
patent: 6885770 (2005-04-01), Matsuura
patent: 7123761 (2006-10-01), Kawano
patent: 2001/0043732 (2001-11-01), Matsuura
patent: 2002/0154800 (2002-10-01), Shinbata
patent: 63-259538 (1988-10-01), None
patent: H10-137230 (1998-05-01), None
patent: 2000-023952 (2000-01-01), None
patent: 2001-307064 (2001-11-01), None
patent: 02/099738 (2002-12-01), None
Canon Kabushiki Kaisha
Canon USA Inc IP Division
Mariam Daniel G
LandOfFree
Radiation area extracting method and image processing apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Radiation area extracting method and image processing apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Radiation area extracting method and image processing apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4144728