Radiation apparatus and method for analysis of analytes in sampl

Details Radiation apparatus and method for analysis of analytes in sampl Radiation apparatus and method for analysis of analytes in sampl

1998-02-26

2000-09-12

Winakur, Eric F.

Surgery

Diagnostic testing

Measuring or detecting nonradioactive constituent of body...

600316, A61B 500

Patent

active

061190268

ABSTRACT:
A technique that uses wavelet analysis to analyze the concentration of an analyte in a sample. The technique includes irradiating the sample with electromagnetic radiation and detecting a resulting radiation from the sample to obtain spectral data. The electromagnetic radiation irradiated on the sample results in radiation interaction, such as reflection, scattering, and transmission, from the sample. The radiation interaction results in a resultant electromagnetic radiation from the sample, such as reflected radiation, scattered radiation, or transmitted radiation. The resultant electromagnetic radiation includes signals indicative of the analyte. The spectral data is digitally processed using wavelet analysis to increase proportionally the signal indicative of the analyte in the data. A modeling algorithm is applied to the processed data to determine the quantitative characteristics of the analyte in the sample.

REFERENCES:
patent: 5490505 (1996-02-01), Diab et al.
patent: 5575284 (1996-11-01), Athan et al.

Affiliated with

Also associated with

Rating

Radiation apparatus and method for analysis of analytes in sampl does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Radiation apparatus and method for analysis of analytes in sampl, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Radiation apparatus and method for analysis of analytes in sampl will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-104616