Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1994-07-15
1996-03-19
Wieder, Kenneth A.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324758, 156160, 156229, G01R 3102
Patent
active
055006043
ABSTRACT:
A membrane test probe (10) for use in testing integrated circuit chips (50) has a thin flexible membrane (30) bearing test contacts (40,42) that is stretched across an opening of a rigid-flex substrate (12). The membrane is manufactured with uniform radial tension by a lamination fixture having a steel pressure plate (76) that includes an annular groove (78). A high temperature O-ring (80) is positioned in the groove against the radially inner wall (82) of the groove with the radially outer wall of the groove being displaced from the outer part of the O-ring. The O-ring has a thickness greater than the depth of the groove and when the steel pressure plate is pressed against the membrane to press it against its substrate the O-ring pushes a portion (92) of the membrane into a shallow groove (16) in the substrate and deforms radially outwardly. As the O-ring deforms radially outwardly, it exerts a radially outwardly directed tension on the membrane which is cured in this radially stretched condition.
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Pike Jack H.
Swarbrick David B.
Denson-Low W. K.
Gudmestad Terje
Hughes Aircraft Company
Khosravi Kourosh Cyrus
Leitereg Elizabeth E.
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