Quiescent current monitor circuit for wafer level integrated cir

Details Quiescent current monitor circuit for wafer level integrated cir Quiescent current monitor circuit for wafer level integrated cir

1997-02-04

1999-06-15

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324763, G01R 3128

Patent

active

059125624

ABSTRACT:
A current monitor circuitry for detecting defects in a semiconductor device through performance of quiescent current testing. The circuitry for performing quiescent current testing may be implemented on chip or in an expendable portion of the wafer or a combination of both. In one embodiment, a quiescent current monitor unit interfaces with the circuit to be tested. The quiescent current monitor includes a sense amplifier and a level detector. The sense amplifier senses for a voltage differential and the level detector checks for a predetermined voltage rise. The voltage differences may be used for verification of specified circuit operations.

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patent: 5442282 (1995-08-01), Rostoker et al.
Hsue, et al., "Built-In Current Sensor For IDDQ Test In CMOS," International Test Conf., pp. 635-641 (1993). (unavailable month).
Rius, et al., "Proportional BIC Sensor For Current Testing ," Electronic Testing: Theory and Appl. vol. 3; pp. 387-396 (1992). (unavailable month).
Rubio, et al., "A Built-In Quiescent Current Monitor For CMOS VLSI Circuits," Eur. Design and Test Conf., pp. 581-585 (1995). (unavailable month).
Maly, et al., "Built In Current Testing," J. Solid-State Circuits, vol. 27, No. 3., pp. 425-428 (1992). (unavailable month).
Keating, et al., "A New Approach To Dynamic IDD Testing, " International Test Conf., pp. 316-321 (1987). (unavailable month).

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