Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1997-06-05
1998-10-27
Do, Diep N.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324672, 324548, G01R 2726
Patent
active
058282220
ABSTRACT:
An output open circuit test method including the steps of inputting the data of a predetermined charging current upper limit value and a predetermined test voltage and a predetermine test charging current time zone into a test apparatus, then employing a high voltage to the test sample, and then driving the test apparatus to measure the current between two ends of the test sample and to compare the measured current value with the predetermined charging current upper limit value, and then letting the test apparatus to start testing the leakage current of the test sample when the measured current value is below the predetermined charging current upper limit value.
REFERENCES:
patent: 3268809 (1966-08-01), Meyer et al.
patent: 3414792 (1968-12-01), Mui et al.
patent: 4697151 (1987-09-01), Butler
patent: 5202640 (1993-04-01), Schaaf et al.
patent: 5510719 (1996-04-01), Yamamoto
patent: 5652521 (1997-07-01), Meyer
patent: 5677634 (1997-10-01), Cooke et al.
Associated Research, Inc.
Do Diep N.
Extech Electronics Co., Ltd.
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