Optics: measuring and testing – By polarized light examination
Patent
1995-03-29
1997-02-25
Sykes, Angela D.
Optics: measuring and testing
By polarized light examination
356338, 606 11, G01N 1502
Patent
active
056064187
ABSTRACT:
A structure and a method provide a quasi bright field particle sensor, using a laser beam of predetermined polarization. A phase shift caused by a particle passing through a laser beam is utilized to detect the presence of a particle. In one embodiment, the laser beam is split into two components of laser beams of orthogonal polarization separated by a predetermined distance, so as to allow detection of both spherical and non-spherical particles. In another embodiment, where only non-spherical particles are detected, a single laser beam is used.
REFERENCES:
patent: 3809478 (1974-05-01), Talbot
patent: 4653760 (1987-03-01), Dyer et al.
patent: 4799796 (1989-01-01), Musha
patent: 4930865 (1990-06-01), Dosman
patent: 5005977 (1991-04-01), Tomoff
patent: 5133602 (1992-07-01), Batchelder et al.
Aqui Derek G.
Borden Peter G.
Harris-Ogugua Sonja
High Yield Technology, Inc.
Kwok Edward C.
Sykes Angela D.
LandOfFree
Quasi bright field particle sensor does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Quasi bright field particle sensor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Quasi bright field particle sensor will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1977922