Measuring and testing – Fluid pressure gauge – Vibration type
Patent
1993-08-31
1995-12-05
Chilcot, Richard
Measuring and testing
Fluid pressure gauge
Vibration type
73708, 73152, 73154, G01L 908
Patent
active
054718821
ABSTRACT:
A pressure transducer assembly for measuring fluid pressure. The transducer assembly includes a thickness-shear mode resonator pressure sensor and a thickness-shear mode resonator temperature sensor for temperature compensation of the pressure sensor. Both sensors are exposed to the pressurized fluid, and possess similar thermal time constants. The temperature sensor possesses a pressure sensitivity less than that of the pressure sensor, and a temperature sensitivity greater than that of the pressure sensor. The pressure and temperature sensors may be of similar size and configuration, and may be fabricated from the same material, such as quartz.
REFERENCES:
patent: 3355949 (1967-12-01), Elwood et al.
patent: 3561832 (1971-02-01), Karrer et al.
patent: 3617780 (1971-11-01), Benjaminson et al.
patent: 4020448 (1977-04-01), Corbett
patent: 4067241 (1978-01-01), Corbett
patent: 4079280 (1978-03-01), Kusters et al.
patent: 4160183 (1979-07-01), Kusters et al.
patent: 4175243 (1979-11-01), Corbett
patent: 4439705 (1984-03-01), Corbett
patent: 4455875 (1984-06-01), Guimard et al.
patent: 4485323 (1984-11-01), Corbett
patent: 4535638 (1985-08-01), EerNisse et al.
patent: 4547691 (1985-10-01), Valdois et al.
patent: 4550610 (1985-11-01), EerNisse
patent: 4562375 (1985-12-01), Besson et al.
patent: 4607530 (1986-08-01), Chow
patent: 4660420 (1987-04-01), EerNisse
patent: 4754646 (1988-07-01), EerNisse et al.
patent: 4802370 (1989-02-01), EerNisse et al.
patent: 4936147 (1990-06-01), EerNisse et al.
patent: 5012151 (1991-04-01), EerNisse et al.
patent: 5221873 (1993-06-01), Totty et al.
patent: 5231880 (1993-08-01), Ward et al.
patent: 5299868 (1994-04-01), Dennis et al.
patent: 5302879 (1994-04-01), Totty et al.
Benedict, Robert P., "Transient Temperature Measurement", Fundamentals of Temperature, Pressure, and Flow Measurements, 1977, pp. 265-271.
Besson, et al., "A Dual-Mode Thickness-Shear Quartz Pressure Sensor", Ultrasonics Symposium, 1991.
EerNisse, Errol P., "Quartz Resonator Pressure Gauge: Design and Fabrication Technology", Sandia Laboratories, Dec. 1978.
Kamal, M. M., "Expected Developments in Transient Testing", JPT, Aug. 1991, pp. 898-997.
Leach, Jerry, "5 MHZ BT Cut Resonators", Proceedings of the 24th Annual Symposium on Frequency Control, Apr. 1970, pp. 117-125.
Chilcot Richard
Felber Joseph L.
Quartzdyne, Inc.
LandOfFree
Quartz thickness-shear mode resonator temperature-compensated pr does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Quartz thickness-shear mode resonator temperature-compensated pr, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Quartz thickness-shear mode resonator temperature-compensated pr will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1366804